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• #4281 Raymond titán

  2010-02-23 16:43:58 #4281

  Összes hozzászólása itt Válaszok az összes hozzászólására itt Válaszok erre a hozzászólásra

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  Raymond

  titán

  Egy uj tanulmany a flash chipek elettartamarol:

  "Abstract
  We examine the write endurance of USB flash drives
  using a range of approaches: chip-level measurements,
  reverse engineering, timing analysis, whole-device endurance
  testing, and simulation. The focus of our investigation
  is not only measured endurance, but underlying
  factors at the level of chips and algorithms—both typical
  and ideal—which determine the endurance of a device.
  Our chip-level measurements show endurance far in
  excess of nominal values quoted by manufacturers, by
  a factor of as much as 100. We reverse engineer
  specifics of the Flash Translation Layers (FTLs) used
  by several devices, and find a close correlation between
  measured whole-device endurance and predictions from
  reverse-engineered FTL parameters and measured chip
  endurance values. We present methods based on analysis
  of operation latency which provide a non-intrusive
  mechanism for determining FTL parameters. Finally we
  present Monte Carlo simulation results giving numerical
  bounds on endurance achievable by any on-line algorithm
  in the face of arbitrary or malicious access patterns."

  Write Endurance in Flash Drives: Measurements and Analysis

  Szep munka

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